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Infinite Innovation, the Future of Industrial Control Systems
Infinite Innovation, the Future of Industrial Control Systems
PRODUCT POSITION:HOMEPRODUCT—AQ6380
AQ6380
The Yokogawa AQ6380 is a premium benchtop optical spectrum analyzer (OSA) designed for high-precision measurement and analysis of optical signals in telecommunications, R&D, and manufacturing applications. It offers exceptional wavelength accuracy, high dynamic range, and fast measurement capabilities, supporting both single-mode and multimode fiber measurements. The AQ6380 is widely used for characterizing lasers, LEDs, optical amplifiers, DWDM systems, and other photonic components.
DESCRIBE
Key Parameters
Parameter Specification
Model Yokogawa AQ6380
Type Optical Spectrum Analyzer (OSA)
Wavelength Range 350 to 1750 nm (Standard)
Wavelength Accuracy ±0.005 nm (C-band typical)
Dynamic Range 78 dB (typical, at 0.1 nm resolution)
Resolution Bandwidth 0.005 to 10 nm (variable)
Sensitivity -90 dBm (typical)
Measurement Speed ≤0.2 seconds/sweep (100 nm span, 0.1 nm res)
Polarization Dependency ≤0.005 dB (typical)
Fiber Interfaces SMF (Single-Mode), MMF (Multi-Mode)
Display 12.1-inch TFT LCD (1280 × 800)
Data Storage Internal HDD, USB interface
Interfaces GPIB, Ethernet (LAN), USB, RS-232
Operating Temperature 5°C to 40°C (41°F to 104°F)
Dimensions 427 × 177 × 370 mm (W × H × D)
Weight Approx. 15 kg
Key Features
Ultra-High Wavelength Accuracy: ±0.005 nm in C-band for precise DWDM analysis.

Wide Dynamic Range: 78 dB enables detection of weak signals amid strong ones.

Fast Measurement Speed: Reduces test time in production environments.

Multi-Application Support: Covers telecom, datacom, and R&D wavelengths (e.g., O to L band).

Advanced Analysis Functions: Includes SNR, OSNR, channel power, and pass/fail testing.

User-Friendly Interface: Touchscreen with intuitive navigation and remote control options.

Robust Connectivity: GPIB, LAN, USB for automation and data transfer.

Applications:

DWDM system characterization

Laser diode and LED testing

Optical amplifier gain/flatness measurement

Filter and multiplexer/demultiplexer evaluation

R&D in photonics and fiber optics

Manufacturing test and quality control
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