The Yokogawa WT5000 is a next-generation precision power analyzer that sets new standards in power measurement technology. Designed to address the evolving demands of modern power electronics, it delivers breakthrough performance with ±0.01% basic power accuracy and an extended frequency bandwidth from DC to 5 MHz. This instrument represents the cutting edge of measurement technology for wide-bandgap semiconductor characterization and ultra-high-efficiency systems.
Specifications
Parameter Specification
Model Yokogawa WT5000 (configurable with 1-4 input elements)
Power Accuracy ±0.01% of reading (45-66 Hz, specific conditions)
Voltage Range 1.0 V to 1000 V (extendable to 2000 V)
Current Range Direct input: 5 mA to 50 A
External sensor: Comprehensive support for various sensors
Bandwidth DC, 0.1 Hz to 5 MHz (-3 dB)
Basic Accuracy ±0.01% reading + ±0.03% range (45-66 Hz)
Power Factor Range 0.0000 to 1.0000 with enhanced low-PF accuracy
Harmonic Measurement Simultaneous measurement up to 1000th order
Sampling Rate Up to 10 MS/s (10 million samples per second)
Integration Function High-precision energy measurement (Wh, Ah)
Data Update Rate 1 ms (1000 readings/s) for transient analysis
Display 10.1-inch high-resolution touchscreen (1920 × 1200 pixels)
Interfaces 10GbE LAN, USB 3.0, GPIB, HDMI, Optical Interface
Operating Temperature 0°C to +40°C
Dimensions (W×H×D) 440 × 177 × 520 mm
Weight Approx. 16 kg (4-element unit)
Key Features
Ultra-high precision: ±0.01% power accuracy sets new industry standards
Extended bandwidth: DC to 5 MHz for next-generation power devices
Advanced sampling: 10 MS/s sampling rate for detailed waveform analysis
Enhanced harmonic analysis: Up to 1000th order harmonic measurement
Superior noise immunity: Advanced filtering and shielding technology
High-resolution display: 10.1-inch touchscreen for detailed visualization
Future-ready interfaces: 10GbE LAN and USB 3.0 for high-speed data transfer
Flexible configuration: 1-4 input elements with complete isolation
Advanced Capabilities
Real-time waveform processing for instant analysis
Advanced mathematical functions for custom calculations
High-speed data logging for transient capture
Enhanced motor analysis capabilities
Sophisticated trigger functions for complex measurements
Comprehensive protocol support for automated testing
Advanced thermal management for stable measurements
Typical Applications
Characterization of wide-bandgap semiconductor devices (SiC, GaN)